Based on the WOSP-LEDO light source we have developed a spectrometer system that can be used to measure reflectance spectra in the wavelength range 270 … 900 nm. The light source is based on LEDs only.
2 array spectrometers (not shown in the images) are used to record the sample signal and a reference signal at the same time. This makes the results independent of light source drifts.
Samples must be positioned within a few mm distance to the sample port of the system. The measured spectra are tolerant against small sample tilts or height differences.
Spectral quality is the same as for WOSP-LEDO. The unit can be used as a light source for transmittance measurements as well.
The system requires an external power supply of 12 V DC.
We have implemented (starting with object generation 4.99) the Leng oscillator which has been developed to model optical constants of semiconductors. As shown in the original article (Thin Solid Films 313-314 (1988) 132-136) it works well for crystalline silicon:
Warning: While the model works fine in the vicinity of strong spectral features (critical points in the joint density of states) it may generate non-physical n and k values in regions of small absorption.
Finally we have introduced a menu command (Actions/Delete selected record) to remove a record from the BREIN database. The action is – of course – password protected.
We have added optical functions which return statistical numbers based on cell values in the workbook or batch control windows. They are useful if you determine thickness profiles and want to display average thickness, minimum and maximum values, as well as standard deviation from the average.
The functions are explained here:
Depending on the configuration, it could happen that the main application brein.exe generated a *.csv file for each processed pane in the BREIN program folder. These files were meant to be generated for BREIN viewer, in the designated transfer folder, but happened to be generated even if BREIN viewer is not used at all.
We have removed this error in the latest version of brein.exe.
A bug in the computation of averaged parameter values in operator views has been fixed.
We have included a new fit option which helps to increase the speed of analysis in time critical applications: In methods which use pre-fit sets in the list of fit parameters you can now include the current fit parameter values in the pre-fit search. This eventually avoids many fit iterations if differences between consecutive measurements are small.
The new feature can be turned on or off in the dialog of fit options.
The Optoplex scanner has been updated – we have improved several small details like the appearance of the database tables. As a new feature, sheet resistance values can now be imported into BREIN in order to be displayed.
We have upgraded several CODE functions related to the technical performance of glazing products.
You can now compute solar pane absorption and pane temperatures for up to 6 glass panes.
The list of integral quantities in CODE features new menu items (in File/options):
- set global climate parameters used for U-value, g-value and temperature computations
- set the window tilt angle for all U-value, g-value and temperature computations
You can display climate values using labels in a view with the following names:
- ‘selected_climate’ (shows the name of the climate)
- ‘selected_climate_parameters’ (shows values of outside temperature, external heat exchange coefficient he, inside temperature, internal heat exchange coefficient, solar power
- ‘selected_climate_ISO52022’ (shows the name of the climate settings for ISO 52022-3 computations)
- ‘selected_climate_parameters_ISO52022’ (shows values of outside temperature, external heat exchange coefficient he, inside temperature, internal heat exchange coefficient, solar power, used for ISO 52022-3 computations)
You can display the value of the window tilt angle using a label called ‘window tilt angle’.
Finally, you can call the following new script commands to open user dialogs in the main view:
- edit climate
- edit window tilt angle
We have made the import of measured traverse spectra from the Zeiss SQL database more flexible. Up to now the scanner processed all new spectra not analyzed by BREIN. In order to do so it sends an SQL search command to the Optoplex Q database filtering out spectra with IDs larger than the last processed ID,
You can now inject more search criteria into the SQL search command filtering in a more complex manner. In order to inject additional search conditions you have to add 2 lines to the optoplex_sql_spectrum_scanner,ini file, The first line is ‘Optoplex Q where phrase’ and the second line the injected SQL fragment. Here is an example:
Optoplex Q where phrase
and (measpointindex = 1 or measpointindex = 10)
When you re-start the scanner it will only process spectra recorded at measurement positions 1 and 10 – all other spectra are ignored.