SCOUT is a thin film analysis software for Windows 7/8/10. Most of our customers use it to extract information from optical measurements, usually by comparing measured spectra with simulated ones. Simulations are based on physical modelling, i.e. spectra are computed based on material constants (complex refractive index) and assumptions on the geometry (layer thicknesses). After successful parameter fits optical constants and layer thickness values are known.


The quality of obtained results is directly coupled to the quality of the optical model. We have put a lot of work and experience into the development of optical constant models. In addition, concepts to handle typical thin film imperfections like surface roughness or depth gradients have been integrated. Another ingredient to successful analysis is the capability of SCOUT to make the same mistakes as real spectrometers: You can take into account the effect of angle of incidence distributions, finite spot size or misalignment.

SCOUT can be used for research projects but also for real-time production control in industry. It can perform measurements by itself, driving spectrometer hardware, or it can be connected to a measurement system to receive measured spectra for analysis. Several spectrometer companies around the world use SCOUT as integrated analytical tool for thin film analysis.

The following types of spectra can be computed:

  • Reflectance (or any user-defined function of it)
  • Transmittance (or any user-defined function of it)
  • Absorbance (or any user-defined function of it)
  • ATR (or any user-defined function of it)
  • Ellipsometry
  • Photoluminescence
  • Electroluminescence


The optical model

Parameter fitting

Other features


Bugfixes and program modifications

SCOUT downloads